2015/05/27 歡迎 本系02級系友 核研所 張佐民博士 蒞臨演講，講題：Application of Atomic Force Microscopy (AFM) in research at the nano-scale

本週邀請到 本系02級系友 核研所 張佐民博士 進行專題演講
講題：Application of Atomic Force Microscopy (AFM) in research at the nano-scale
時間：2015/05/27 15:30~17:20
地點：NE69演講廳

Atomic force microscopy (AFM) is an essential tool for characterizing the physical/chemical properties of materials, providing a high degree of sensitivity as well as spatial resolution at the micro-/nano-scale. AFM can be used to study the topography, viscoelasticity (stiffness/softness), adhesion characteristics, friction, and even the electrical properties of biological as well as non-biological samples. This presentation provides a brief introduction to the history and principles of AFM. We also examine several advanced applications in material/biological/electrical research, including (1) an investigation of the corrosion behavior of 304L stainless steel using confocal laser scanning microscopy (CLSM) and atomic force microscopy (AFM), (2) the measurement of the interaction force of CTX-protein on mixed SAMs surfaces, (3) the measurement of elasticity in neurons, and (4) the concept underlying the charged single Teflon nanoparticle tip (sTNP tip) for advanced research in AFM.