友善列印 - 2017/03/29 歡迎張智傑博士，Nova Measuring Instruments Ltd. 蒞臨演講，講題：Metrology techniques for physical evaluation to next generation semiconductor devices

2017/03/29 歡迎張智傑博士，Nova Measuring Instruments Ltd. 蒞臨演講，講題：Metrology techniques for physical evaluation to next generation semiconductor devices

本次邀請到張智傑博士，Nova Measuring Instruments Ltd. 進行專題演講

講題：Metrology techniques for physical evaluation to next generation semiconductor devices

時間：2017/03/29 15 30~17:20

地點：NE69 演講廳